Cascade Microtech Inc. announced the release of its new EDGE(TM) 1/f (flicker) noise measurement solution with 1 Hz to 40 MHz coverage. The EDGE module is a field-upgradable retrofit to most Cascade Microtech probe stations and includes software tools for 1/f noise modeling and statistical analysis which support noise measurement up to 10 MHz. In addition, with the new EDGE hardware, Cascade Microtech now offers a lower cost, fully integrated EDGE measurement system for frequency ranges up to 40 MHz, which includes site preparation, validation, and equipment installation. Both solutions utilize new software with features such as advanced graphical viewer, statistical analysis, and automatic report creation. With carefully engineered ultra-low background noise, EDGE 1/f noise measurement solutions offer low-level noise measurement over the widest commercially available frequency range (1 Hz to 40 MHz) for flicker noise measurement as well as standard DC parametric testing. EDGE solutions address 1/f noise characterization for semiconductor devices, 1/f noise model parameter extraction, and process reliability evaluation using 1/f noise data. EDGE assures "noise-free" operation even when testing over a thermal range of -60 degrees C to 300 degrees C. The EDGE module and EDGE system offer multi-die and multi-site wafer stepping and have the lowest level of extrinsic noise, unmatched noise immunity, and the widest bandwidth (1 Hz to 40 MHz) in the market.

Cascade Microtech Inc. reported unaudited consolidated earnings results for the fourth quarter and year ended December 31, 2009. For the quarter, the company reported loss from operations of $3,198,000, loss before tax of $3,171,000 and net loss of $489,000 or $0.04 per basic and diluted share on sales of $15,485,000 compared with loss from operations of $33,214,000, loss before tax of $32,791,000 and net loss of $31,412,000 or $2.39 per basic and diluted share on sales of $15,387,000 for the same period a year ago. For the full year, the company reported loss from operations of $10,962,000, loss before tax of $10,555,000 and net loss of $7,649,000 or $0.57 per basic and diluted share on sales of $53,541,000 compared with loss from operations of $37,862,000, loss before tax of $36,824,000 and net loss of $34,577,000 or $2.65 per basic and diluted share on sales of $76,561,000 for the same period a year ago. Based on the current backlog, anticipated bookings and the current market environment, Cascade anticipates that first quarter 2010 revenues, which includes anticipated revenues from the acquisition of Suss MicroTech Test Systems division from the acquisition date will be in the range of $19.0 million to $23.0 million.

Cascade Microtech Inc. and SUSS MicroTec AG announced that they have entered into a strategic partnership to address the growing device complexities of emerging semiconductor technologies such as 3D TSV manufacturing and test. Over the last few decades Moore's Law (the doubling of device performance every two years) has enabled the semiconductor companies to increase speed, functionality and complexity while reducing cost at the same time. As companies are driving beyond 32 nm, the cost position becomes less favorable and interconnect technology is limiting performance gains. Emerging 3D methodologies (the stacking of one die or wafer on top of another) are addressing these dilemmas. Adoption of 3D TSV (Through-Silicon Via) is the ultimate in 3D integration providing higher performance, reduced noise, smaller device form factor, and modularity in construction at potentially lower cost. By forming a strategic alliance, the two companies will bring innovative approaches to the 3D TSV manufacturing processes. Both companies will use their associations with leading research organizations such as IMEC, as well as industry partnerships, to gain insight into this cutting-edge methodology driving beyond Moore's Law. Further collaboration with device and reliability experts will allow the alliance to address the complexities and interactions of semiconductor bonding and test probing for next-generation semiconductor devices.

Cascade Microtech Expands 1/f Noise Measurement Solution to Address Frequency Range of 1 Hz to 40 MHz

Cascade Microtech Expands 1/f Noise Measurement Solution to Address Frequency Range of 1 Hz to 40 MHz

Cascade Microtech Acquires Test Systems Division of Suess Microtec AG Call scheduled for 10:45 am ET today

Cascade Microtech and SUSS MicroTec Forge Technology Alliance

Cascade Microtech Acquires Test Systems Division of SUSS MicroTec AG

Cascade Microtech, Inc. and SUSS MicroTec AG Agree to Pursue Technology Alliance

Cascade Microtech Reports Fourth Quarter and 2009 Year End Results

CASCADE MICROTECH INC Files SEC form 8-K, Change in Directors or Principal Officers, Financial Statements and Exhibit

Cascade Microtech Reports Fourth Quarter and 2009 Year End Results

Q4 2009 Cascade Microtech, Inc. Earnings Release - Time Not Supplied

CASCADE MICROTECH INC Files SEC form 8-K, Results of Operations and Financial Condition, Financial Statements and Exh

Cascade Microtech and SUSS MicroTec Forge Technology Alliance

CASCADE MICROTECH INC Files SEC form 8-K, Unregistered Sale of Equity Securities

Cascade Microtech Acquires Test Systems Division of SUSS MicroTec AG

Cascade Microtech, Inc. and SUSS MicroTec AG Agree to Pursue Technology Alliance

Cascade Microtech, Inc. Earnings Call scheduled for Tue, Feb 9

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